Spectrochimica Acta Part B Virtual Special Issue on the 17th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
Contributo in Atti di convegno
Data di Pubblicazione:
2018
Abstract:
This Virtual Special Issue (VSI) provides an overview of the most
novel and original research presented during the 17th International
Conference on Total Reflection X-Ray Fluorescence Analysis and Related
Methods (TXRF 2017).
The TXRF 2017was held on September 19–22, 2017 in Brescia, Italy.
The aimof the conferencewas to bring together experts, users andmanufacturers
of total reflection X-ray fluorescence (TXRF) spectrometers
to present and discuss recent advances, research results and perspectives.
Emphasis is given to potential applications of TXRF and related
methods for trace and ultra-trace analysis in environmental, semiconductor,
nanomaterials, food, cosmetics, fuels, energy and archaeometry,
biology, synchrotron radiation, instrument and modelling fields.
TXRF2017 was an important and effective opportunity for substantial
discussions, exchange of knowledge and experience.
A total of 89 participants from 22 countries attended TXRF 2017, including
4 plenary lectures, 16 invited speakers, 54 oral presentations
and 49 poster presentations.
novel and original research presented during the 17th International
Conference on Total Reflection X-Ray Fluorescence Analysis and Related
Methods (TXRF 2017).
The TXRF 2017was held on September 19–22, 2017 in Brescia, Italy.
The aimof the conferencewas to bring together experts, users andmanufacturers
of total reflection X-ray fluorescence (TXRF) spectrometers
to present and discuss recent advances, research results and perspectives.
Emphasis is given to potential applications of TXRF and related
methods for trace and ultra-trace analysis in environmental, semiconductor,
nanomaterials, food, cosmetics, fuels, energy and archaeometry,
biology, synchrotron radiation, instrument and modelling fields.
TXRF2017 was an important and effective opportunity for substantial
discussions, exchange of knowledge and experience.
A total of 89 participants from 22 countries attended TXRF 2017, including
4 plenary lectures, 16 invited speakers, 54 oral presentations
and 49 poster presentations.
Tipologia CRIS:
4.1 Contributo in Atti di convegno
Keywords:
Analytical Chemistry; Atomic and Molecular Physics, and Optics; Instrumentation; Spectroscopy
Elenco autori:
Borgese, Laura; Depero, Laura Eleonora
Link alla scheda completa:
Titolo del libro:
Virtual Special Issue on the 17th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
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