X-ray reflectivity study of the structural properties of SiO2 and SiOF thin films

Academic Article

Publication Date:

2001

CRIS type:

1.1 Articolo in rivista

List of contributors:

Ceriola, G.; Iacona, F.; LA VIA, F; Raineri, V; Bontempi, Elza; Depero, Laura Eleonora

Authors of the University:

BONTEMPI Elza

DEPERO Laura Eleonora

Handle:

https://iris.unibs.it/handle/11379/18132

Published in:

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Journal