Tailoring phase and composition at the nanoscale: Atomic layer deposition of Zn-Ti-O thin films
Articolo
Data di Pubblicazione:
2011
Abstract:
Different Zn-Ti-O phases were prepared with high reproducibility in the form of very thin films (thickness: 40 nm) by alternating atomic layer deposition cycles of TiO(2) and ZnO precursors at 90 degrees C, followed by annealing at 600 degrees C. This procedure enables a very fine control of stoichiometry and the achievement of unexpected zinc titanate phases.
Tipologia CRIS:
1.1 Articolo in rivista
Keywords:
Zn-Ti-O phases; ALD; thin film
Elenco autori:
Borgese, Laura; Bontempi, Elza; Depero, Laura Eleonora; Colombi, Paolo; Alessandri, Ivano
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