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RDF description of Structural characterization of V2O5-TiO2 thin films deposited by RF sputtering from a titanium target with vanadium insets - http://irises.unibs.it/resource/item/23230
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date: 2026-08-25T05:44:45
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Structural characterization of V2O5-TiO2 thin films deposited by RF sputtering from a titanium target with vanadium insets
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