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RDF description of Bidimensional X-ray diffraction analysis for structural and microstructural characterization of lanthanum manganite thin films - http://irises.unibs.it/resource/item/19242
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date: 2026-08-26T17:58:15
publisher: Bidimensional X-ray diffraction analysis for structural and microstructural characterization of lanthanum manganite thin films
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